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Memory test device with write and pseudo write signals

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Memory test method and nonvolatile memory with low error...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Memory test mode for charge retention testing

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Memory testing

Static information storage and retrieval – Read/write circuit – Testing
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Memory testing apparatus

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Memory testing apparatus for microelectronic integrated circuit

Static information storage and retrieval – Read/write circuit – Testing
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Memory testing apparatus for microelectronic integrated circuit

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Memory testing method and memory testing apparatus

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Memory testing system and memory module thereof

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Memory testing through cumulative word line activation

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Memory testing with preservation of in-use data

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Memory that retains data when switching partial array self...

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Memory that stores multiple bits per storage cell

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Memory trouble relief circuit

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Memory unit and semiconductor device

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Memory unit and semiconductor device

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Memory unit and semiconductor device

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Memory unit having programmable device ID

Static information storage and retrieval – Read/write circuit
Reexamination Certificate

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Memory unit with bit line discharger

Static information storage and retrieval – Read/write circuit – Accelerating charge or discharge
Patent

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Memory unit with sensing current stabilization

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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