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Alignment of magnetic heads for automatic identification of...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Alignment of multi-channel diffractive WDM device

Optics: measuring and testing – Angle measuring or angular axial alignment – Alignment of axes nominally coaxial
Reexamination Certificate

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Alignment of optical components

Optics: measuring and testing – Angle measuring or angular axial alignment – With photodetection remote from measured angle
Patent

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Alignment of optical components

Optics: measuring and testing – Angle measuring or angular axial alignment – Alignment of axes nominally coaxial
Patent

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Alignment of optical elements in telescopes using a laser beam w

Optics: measuring and testing – Angle measuring or angular axial alignment – Alignment of axes nominally coaxial
Patent

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Alignment of optical fiber to optical port of integrated...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

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Alignment of optical waveguides

Optics: measuring and testing – Angle measuring or angular axial alignment – Alignment of axes nominally coaxial
Patent

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Alignment of radiation receptor with lens by Fourier optics

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Alignment of substrates for bonding

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Alignment patterns for two objects to be aligned relative to eac

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Alignment process for integrated circuit structures on...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Alignment range for multidirectional construction laser

Optics: measuring and testing – Angle measuring or angular axial alignment – With photodetection remote from measured angle
Patent

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Alignment reticle for a semiconductor wafer stepper system and m

Optics: measuring and testing – By alignment in lateral direction
Patent

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Alignment routine for optically based tools

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Alignment routine for optically based tools

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Alignment routine for optically based tools

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Alignment self check for a wavelength meter

Optics: measuring and testing – By light interference – Spectroscopy
Reexamination Certificate

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Alignment sensor

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Alignment stabilization prism

Optics: measuring and testing – Angle measuring or angular axial alignment – With photodetection remote from measured angle
Patent

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Alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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