Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate
2008-05-20
2008-05-20
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
C382S151000, C355S077000, C430S030000
Reexamination Certificate
active
10604010
ABSTRACT:
A method is provided for using a point of interest as a starting point where an alignment is automatically selected by recognition software for a patterned substrate. The method includes disposing the patterned substrate on a stage of an exposure system, the exposure system having an alignment routine including; locating a first point of interest on the patterned substrate; scanning a first area proximate the first point of interest for a first unique feature; defining a periodicity for the patterned substrate; locating a second point of interest based on the periodicity; scanning a second area proximate the second point of interest for a second unique feature corresponding to the first unique feature; gathering alignment data from at least scanning the first and second areas; and determining substrate position relative to the exposure system from alignment data of at least the first and second scanned areas.
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International Business Machines - Corporation
Jaklitsch Lisa U.
Stock, Jr. Gordon J
Toatley , Jr. Gregory J.
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