Alignment self check for a wavelength meter

Details Alignment self check for a wavelength meter Alignment self check for a wavelength meter

2006-07-11

2006-07-11

Lee, Hwa Andrew (Department: 2877)

Optics: measuring and testing

By light interference

Spectroscopy

C356S450000

Reexamination Certificate

active

07075655

ABSTRACT:
An alignment self check of a wavelength meter is performed. A reference signal is placed into a reference signal path of the wavelength meter. The reference signal is also placed into an unknown signal path of the wavelength meter. It is then detected whether after traveling through the unknown signal path, the reference signal has a same period as after traveling through the reference signal path.

REFERENCES:
patent: 4444501 (1984-04-01), Schwiesow
patent: 5657122 (1997-08-01), Curbelo et al.
patent: 6219146 (2001-04-01), Innes et al.
patent: 2003/0058452 (2003-03-01), Morris et al.
Dennis Derickson, “Fiber Optic Test and Measurement”, Prentice Hall, Inc., 1998, pp. 133-141.
“Agilent 86120C Multi-Wavelength meter Technical Specifications,” available from Agilent Technologies as Publication No. 5968-1045E, Mar. 2000.

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