Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1992-07-21
1994-08-23
Warden, Robert J.
Optics: measuring and testing
By polarized light examination
With birefringent element
356356, G01B 1100, G02B 518
Patent
active
053412133
ABSTRACT:
method and apparatus for aligning a photoreceptor, such as a CCD array, at a back focal plane of a lens, as may be employed in the construction of a sensor of an imaging system, employs a pair of sine-wave gratings arranged perpendicularly to each other and disposed in front of the lens. An illuminating beam of collimated monochromatic light propagates through the gratings and the lens to form a two-dimensional diffraction pattern on the photoreceptor. Beam splitting optics are employed between a source of the illuminating beam and the gratings to split the illuminating beam into a first beam and a second beam which are inclined equally to an optical axis of the lens to produce two of the foregoing diffraction patterns offset from each other in a resulting composite diffraction pattern. Elements of the pattern undergo displacement from their correct positions in response to a tilting and/or displacement of the photoreceptor from its correct position and orientation in the back focal plane. The configuration of the diffraction pattern with the elements in their correct positions may be referred to as a reference pattern. Deviations of the diffraction pattern from the reference pattern indicate the requisite movements of the photoreceptor to accomplish alignment.
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Avco Corporation
Torres Ramon
Warden Robert J.
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