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Two-beam interferometer for Fourier spectroscopy with rigid pend

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Two-beam photometer with rotatable graded interference filter

Optics: measuring and testing – Refraction testing – Prism engaging specimen
Patent

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Two-color focal plane array sensor arrangement

Optics: measuring and testing – By shade or color – With sample responsive to plural colors applied simultaneously
Patent

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Two-coordinate length measuring device for microscopic instrumen

Optics: measuring and testing – Fiducial instruments – Reticle lies outside viewing path
Patent

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Two-detector gas filter correlation radiometry (GFCR) system...

Optics: measuring and testing – For light transmission or absorption – Of fluent material
Reexamination Certificate

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Two-dimensional angle of arrival detection device

Optics: measuring and testing – Lamp beam direction or pattern
Reexamination Certificate

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Two-dimensional beam deflector

Optics: measuring and testing – Dimension – Thickness
Reissue Patent

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Two-dimensional beam deflector

Optics: measuring and testing – Dimension – Thickness
Reissue Patent

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Two-dimensional beam deflector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Two-dimensional beam deflector

Optics: measuring and testing – Dimension – Thickness
Reissue Patent

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Two-dimensional colorimeter

Optics: measuring and testing – By shade or color – Tristimulus examination
Patent

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Two-dimensional estimation technique for doppler optical...

Optics: measuring and testing – Velocity or velocity/height measuring – With light detector
Reexamination Certificate

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Two-dimensional imaging with line arrays

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Two-dimensional modulation transfer function measurement techniq

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

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Two-dimensional nanopositioner with crude and fine stages

Optics: measuring and testing – Position or displacement
Reexamination Certificate

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Two-dimensional optical scatterometer apparatus and process

Optics: measuring and testing – Of light reflection
Patent

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Two-dimensional opto-electronic imager for millimeter and microw

Optics: measuring and testing – By polarized light examination
Patent

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Two-dimensional position detecting method and apparatus

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Two-dimensional positioning apparatus and method for...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Two-dimensional profile detection system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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