Two-dimensional profile detection system

Optics: measuring and testing – By polarized light examination – With light attenuation

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

G01B 1124

Patent

active

051826143

ABSTRACT:
The invention disclosed herein relates to a detection system for a profile line on an observed body which uses a linear array of sequentially energized energy beam emitters to project beams toward the body. Reflections of the beams are detected by a linear array of energy beam receivers which monitor wedge shaped sectors within a field of view. The known sequence of beam projection and the known sector of reception of reflected beams are used to identify points in space on the profile line.

REFERENCES:
patent: 4180326 (1979-12-01), Chang
patent: 4875777 (1989-10-01), Harding
patent: 4894551 (1990-01-01), Kishimoto et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Two-dimensional profile detection system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Two-dimensional profile detection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Two-dimensional profile detection system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1415647

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.