Optics: measuring and testing – By polarized light examination
Patent
1997-09-30
1999-11-23
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
356351, 3242441, G01J 400, G01R 3302
Patent
active
059910364
ABSTRACT:
A two-dimensional imager for measuring the electric-field amplitude and phase distribution across an extended spatial region for millimeter and microwave electro-magnetic waves. The imager consists of a small active area within a generally passive structure which measures the electric (E)-field amplitude and phase information and impresses this information onto an optical beam. The E-field information is measured by converting the optical signal into and electrical signal and demodulating the E-field information from the electrical signal by processing electronics where the electrical signal is conditioned, stored and the data displayed.
REFERENCES:
patent: 3950103 (1976-04-01), Schmidt-Weinmar
patent: 4533829 (1985-08-01), Miceli et al.
patent: 5166598 (1992-11-01), Gallegos et al.
patent: 5227715 (1993-07-01), Ito et al.
patent: 5278499 (1994-01-01), Ito et al.
Imaizumi et al., Electric Field Distribution Measurement of Microstrip Annas and arrays using electro-optic, Sampling, IEEE Trans. Micro. Theory and Tech., vol. 43, No. 9, pp. 2402-2407, Sep. 95.
Rahnat-Samii et al., The UCLA Bi-Polar Planar-Near-Field Antenna-Measurement and Diagnostics Range, IEEE Ant. and Prop, Mag, vol. 43, pp. 16-35, Dec. 95.
Wu et al., Dynamic Range of an Electro-Optic Field Sensor and its imaging applications, Appl. Phys. Lett. vol. 68, No. 23, pp. 3224-3226, Jun. 96.
Pfiefer et al., Electro-Optic Measurement of the Electric Neal-Field Distribution of 7 GHZ Planac Resonator, Elec. Lett., vol. 32, No. 14, pp. 1305-1307, Jul. 96.
Edelberg Barry A.
Pham Hoa Q.
Stockstill Charles J.
The United States of America as represented by the Secretary of
LandOfFree
Two-dimensional opto-electronic imager for millimeter and microw does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Two-dimensional opto-electronic imager for millimeter and microw, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Two-dimensional opto-electronic imager for millimeter and microw will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1228315