Two-beam photometer with rotatable graded interference filter

Details Two-beam photometer with rotatable graded interference filter Two-beam photometer with rotatable graded interference filter

1975-06-20

1977-04-12

Corbin, John K.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

356205, 356229, G01J 350, G01N 2124

Patent

active

040171914

ABSTRACT:
The two-beam photometer is suitable for extinction measurement on weakly-absorbent samples. The principle of measurement is based on a wavelength selection in either the comparison beam and the measuring beam. In the beam configuration measuring and comparison beam are coincident in space and follow each other periodically. The wavelength ranges in measuring beam and comparison beam is selected by a graded interference filter which is arranged perpendicular to the optical axis and rotatable about this axis. In the zone of the graded interference filter the path of the beam is formed by two narrowly limited beams symmetrically to the optical axis. Both beams are produced preferably by two light sources whose distance may be varied in a direction perpendicular to the optical axis while the symmetry with respect to the optical axis is maintained.

REFERENCES:
patent: 3811781 (1974-05-01), Lowy

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