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Scanning fingerprint reading

Optics: measuring and testing – Document pattern analysis or verification
Patent

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Scanning fluorescent systems for various diagnostic

Optics: measuring and testing – By dispersed light spectroscopy – For spectrographic investigation
Reexamination Certificate

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Scanning force microscope with detector probe for the atomic res

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning heads for transparencies

Optics: measuring and testing – For light transmission or absorption
Patent

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Scanning heterodyne acousto-optical interferometers

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning imaging system having reduced detected signal aliasing

Optics: measuring and testing – Photometers – Photoelectric
Patent

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Scanning interferometer

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning interferometer control systems

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning interferometer for aspheric surfaces and wavefronts

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometer for aspheric surfaces and wavefronts

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometer for aspheric surfaces and wavefronts

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometer for aspheric surfaces and wavefronts

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometer sensor system

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Scanning interferometric methods and apparatus for measuring...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometric near-field confocal microscopy

Optics: measuring and testing – By light interference
Reexamination Certificate

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Scanning interferometric near-field confocal microscopy with...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometry

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometry for thin film thickness and surface...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometry for thin film thickness and surface...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Scanning interferometry for thin film thickness and surface...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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