Scanning interferometer sensor system

Optics: measuring and testing – By particle light scattering – With photocell detection

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356345, G01B 902

Patent

active

051667487

ABSTRACT:
An on-line scanning sensor system includes a mid-infrared spectrophotometric analyzer, such as an interferometer, that can be used on-line in manufacturing environments. More particularly, the on-line scanning sensor system includes a first carriage for scanning motion across a traveling sheet of material; interferometer components that are carried by the first carriage and that includes devices for splitting and recombining infrared light, and for directing a collimated beam of the recombined light onto a traveling web of sheet material. Further, the system includes a detector system for receiving light from the interferometer components during scanning.

REFERENCES:
patent: 3861804 (1975-01-01), Lehmbeck
patent: 4748329 (1988-05-01), Cielo et al.

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