Scanning interferometer control systems

Details Scanning interferometer control systems Scanning interferometer control systems

1982-03-05

1983-11-08

Sikes, William L.

Optics: measuring and testing

By particle light scattering

With photocell detection

318640, G01B 902

Patent

active

044139080

ABSTRACT:
A scanning interferometer is provided with a substantially monochromatic reference beam having a wavelength outside the spectral region of principal interest. Modulation of the reference beam provides a measure of the scan velocity that is compared with a stablized time reference to provide an error signal used to regulate the scan velocity. Modulation of the reference beam also provides a fringe count. At a predetermined count, the time reference is changed in a pre-arranged manner, providing a pre-established scan acceleration sequence at the end of each scan. The acceleration sequence is selected to insure the direction of the scan is reversed within a quarter wave interval of the fringe count, insuring the fidelity of the fringe-count of the monochromatic reference source.

REFERENCES:
patent: 3488123 (1970-01-01), Nichols
patent: 3634682 (1972-01-01), Gold
patent: 4138727 (1979-02-01), Mantz

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