4. Optics: measuring and testing
  Search
Selected: F
All A B C D E
F
G H I J K L M N O P Q R S T U V W X Y Z 0 1 2 3 4 5 6 7 8 9 ! " $ ' ( ) * , - / : < = > ? @ [ \ ] ^ ` { | } ~ €

Film thickness and free carrier concentration analysis method an

Optics: measuring and testing – For optical fiber or waveguide inspection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness detector

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness mapping using interferometric spectral imaging

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measurement apparatus with tilting stage and meth

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measurement of structures containing a scattering

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measurements using light absorption

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring apparatus employing intensity compensat

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring apparatus employing microprojector of s

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring apparatus, film thickness measuring met

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring device and method

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring method and apparatus

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring method and measuring apparatus for...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring method and step measuring method

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring method of member to be processed...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring method of member to be processed...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness measuring method of member to be processed...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Film thickness testing apparatus and method

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.

Canada

 Charities
 Companies
 MP Candidates
 Patents
 Employee Salary Disclosure

World

 Places of the World
 Scientific Papers

United States

 Banks
 Companies
 Counties
 Patents
 Employee Salary Disclosure