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Compensating polarization mode dispersion in fiber optic...

Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate

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Compensating polarization mode dispersion in fiber optic...

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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Compensating system for inspecting potentially warped printed ci

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Compensation and control of both first-order and...

Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate

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Compensation for effects of mismatch in indices of...

Optics: measuring and testing – By light interference – For dimensional measurement
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Compensation for errors in off-axis interferometric...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Compensation for geometric effects of beam misalignments in...

Optics: measuring and testing – By light interference – For dimensional measurement
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Compensation for measurement uncertainty due to atmospheric...

Optics: measuring and testing – By light interference – For refractive indexing
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Compensation for measurement uncertainty due to atmospheric...

Optics: measuring and testing – By light interference – For refractive indexing
Reexamination Certificate

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Compensation of effects of atmospheric perturbations in...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

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Compensation of refractivity perturbations in an...

Optics: measuring and testing – By light interference – For dimensional measurement
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Compensator which experiences thermal expansion to compensate fo

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Complete diagnostics of ultrashort pulses without nonlinear proc

Optics: measuring and testing – By particle light scattering – With photocell detection
Patent

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Component analyzing apparatus with microchip

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate

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Component inspection apparatus and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Component mounter and mounting method

Optics: measuring and testing – Position or displacement
Reexamination Certificate

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Component mounter and recognition method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Component placement machine and method of placing a component on

Optics: measuring and testing – By alignment in lateral direction
Patent

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Component shape profiling method and component mounting method

Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate

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Component transporting apparatus and method

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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