Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate
2006-11-14
2006-11-14
Evans, F. L. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
With sample excitation
C356S417000, C356S344000
Reexamination Certificate
active
07136161
ABSTRACT:
A component analyzing apparatus includes a microchip having a fine separating flow path for separating components when a sample solution labeled with fluorescence passes therethrough. A light irradiation device is arranged to irradiate light to a predetermined area of the microchip at a predetermined angle so that the proximity field light irradiates at least a portion of the separating flow path of the microchip. A light detecting device is disposed above the microchip to receive the fluorescence discharged from the sample solution labeled with fluorescence present in the separating flow path with the proximity field light generated from light irradiated by the light irradiating device as excitation light.
REFERENCES:
patent: WO 01/53822 (2001-07-01), None
Evans F. L.
Kanesaka Manabu
Shimadzu Corporation
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