Component analyzing apparatus with microchip

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

Reexamination Certificate

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C356S417000, C356S344000

Reexamination Certificate

active

07136161

ABSTRACT:
A component analyzing apparatus includes a microchip having a fine separating flow path for separating components when a sample solution labeled with fluorescence passes therethrough. A light irradiation device is arranged to irradiate light to a predetermined area of the microchip at a predetermined angle so that the proximity field light irradiates at least a portion of the separating flow path of the microchip. A light detecting device is disposed above the microchip to receive the fluorescence discharged from the sample solution labeled with fluorescence present in the separating flow path with the proximity field light generated from light irradiated by the light irradiating device as excitation light.

REFERENCES:
patent: WO 01/53822 (2001-07-01), None

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