Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-12-23
1997-04-08
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356385, G01B 1100
Patent
active
056193289
ABSTRACT:
The invention is adapted to be embodied in a component measuring system for measuring a component in an optical detecting station. A pick up device is supported for movement in a first direction and is rotatable about an axis. An optical detection station having an optical range limited in height is defined by a plurality of parallel light rays. The pick up device moves a component held thereby into the optical range. The device measures at least one dimension of said first area of said component and determines whether this area was correctly measured.
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Evans F. L.
Yamaha Hatsudoki Kabushiki Kaisha
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