Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2006-03-07
2010-11-30
Punnoose, Roy (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
Reexamination Certificate
active
07843573
ABSTRACT:
A method for profiling the shape of a component using a line sensor (110) which is provided in a component mounter (100) and which profiles the shape of the component (200) three-dimensionally by (a) projecting a sweeping light onto the component (200) in a relative movement between the line sensor (110) and the component (200) held by a mounting head (103) so that the sweeping light traverses the direction of the movement and (b) detecting the reflected light from the component using a detector (119). The method includes getting the component (200) from the component supply unit101using the mounting head (103), rotating the component (200) by a predetermined angle within a predetermined surface, and profiling the shape of the rotated component using the line sensor (110).
REFERENCES:
patent: 6144452 (2000-11-01), Hachiya
patent: 6195165 (2001-02-01), Sayegh
patent: 6211958 (2001-04-01), Hachiya et al.
patent: 2004/0119987 (2004-06-01), Madsen et al.
patent: 2004-235671 (2004-08-01), None
Hachiya Eiichi
Hada Junichi
Panasonic Corporation
Punnoose Roy
Wenderoth , Lind & Ponack, L.L.P.
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