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Method of and apparatus for article inspection including...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of and apparatus for automatic high-speed optical inspect

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of and apparatus for detecting a surface condition of...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of and apparatus for inspecting a curved shape

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of and apparatus for inspecting reticle for defects

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

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Method of and device for detecting micro-scratches

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of apparatus for detecting particles on a specimen

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of apparatus for detecting particles on a specimen

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of apparatus for detecting particles on a specimen

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of apparatus for detecting particles on a specimen

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of characterizing flare

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of defect inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of defect inspection of graytone mask and apparatus...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of detecting and classifying scratches and particles...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of detecting and classifying scratches, particles and...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of detecting degradation in photolithography...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of detecting mask defects, a computer program and...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of evaluating optical element

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Method of inspecting a defect on a translucid film

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent

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Method of inspecting a semiconductor device and an apparatus...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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