LandOfFree - US Patents - Listing for Optics: measuring and testing,Inspection of flaws or impurities,Surface condition

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Object detecting apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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On-the-fly automatic defect classification for substrates...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optic probe for semiconductor characterization

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optic probe for semiconductor characterization

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical apparatus for defect and particle size inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical apparatus for rapid defect analysis

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Patent

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Optical compensation in high numerical aperture photomask...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical defect inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical disc inspection equalization system and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Patent

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Optical inspection apparatus and optical inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical inspection apparatus and optical inspection method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical inspection device and lithographic apparatus provided wi

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Patent

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Optical inspection including partial scanning of wafers

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical inspection method and apparatus having an enhanced...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical inspection method and apparatus utilizing a variable...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical inspection method and apparatus utilizing a variable...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical inspection method and apparatus utilizing a...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical inspection method and optical inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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Optical inspection method and optical inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

Optical inspection method and optical inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

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