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Component inspection apparatus and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Component mounter and recognition method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Computerized three dimensional data acquisition apparatus and me

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Concentration measuring instrument

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Concentration measuring instrument, concentration measuring...

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Concurrent measurement and cleaning of thin films on...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Configuration detecting method and system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Confocal measuring microscope with automatic focusing

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Conical refraction polarimeter

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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Contactless relative movement sensor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Continuous contactless measurement of profiles and apparatus for

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Contour line scanner

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Contour measurement system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Contour measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Control of beam spot size in ellipsometer and the like systems

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Control of beam spot size in ellipsometer and the like systems

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Control of beam spot size in ellipsometer and the like systems

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Control of uncertain angle of incidence of beam from Arc lamp

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Control system for a continuous cell target readout in a laser m

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Control system for automatic electronic-part mounter

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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