Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-10-20
1998-06-30
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356386, 25055923, G01B 1124, G01B 1110
Patent
active
057742200
ABSTRACT:
In a process for continuous contactless measurement of profiles, in particular profiles moving in the axial direction, by means of which internal contours of a profile can also be measured, where they can be reached by a measurement beam and permit reflection onto a receiver, probes, by means of which a surface segment of an object is continuously scanned in accordance with the triangulation principle by means of a laser light measurement beam in a particular measurement region of the respective probe sequentially or by points one after the other and with a variable and pre-settable step size or resolution within the measurement region, and using the beam reflected by the object surface and received by a fixed receiver on the basis of the geometrical relationships the spacing of each measured point from the probe is determined in the form of local measured data, are arranged in a mounting all around the profile and spaced therefrom and are arranged in predetermined angular positions with respect to one another such that a contour segment of the profile is associated with the measurement region of each probe as a surface segment, in particular with overlapping measurement regions of adjacent probes and with a system calibration having a reference workpiece with precise contours and dimensions, for transferring the contour segments to a global coordinate system and for grouping them together to form an overall image.
REFERENCES:
patent: 5028798 (1991-07-01), Biswas et al.
patent: 5073816 (1991-12-01), Wakefield et al.
Patent Abstracts of Japan, vol. 6, No. 248 (P-60)(1126), Dec. 7, 1982.
Patent Abstracts of Japan, vol. 9, No. 72 (P-345)(1795), Apr. 2, 1985.
Evans F. L.
Mesacon Gesellschaft fur Messtechnik mbH
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