Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-04-23
1994-11-29
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
250561, 433 29, G01B 1124
Patent
active
053694902
ABSTRACT:
A contour measuring apparatus comprises a laser measurement unit, a mount table for mounting an object, a motor for rotating the mount table around an axis, an altering jig for supporting the mount table and the motor and altering a direction of the axis with respect to the laser measurement unit, and a drive table for supporting the altering jig and driving the altering jig to alter a position of the mount table with respect to the laser measurement unit. A method for measuring contour comprises the steps of measuring a top plane contour of the object by the above contour measuring apparatus to obtain top plane contour data relating to a top plane measurement coordinate system, measuring a side plane contour of the object by the contour measuring apparatus to obtain side plane contour data relating to a side plane measurement coordinate system, and making the top plane and side plane measurement coordinate systems coincident to obtain overall contour data of the object in accordance with the top plane contour data and the side plane contour data.
REFERENCES:
patent: 3867032 (1975-02-01), Bruck
Baba Masami
Kawai Masaharu
Miyoshi Katsuya
Nikon Corporation
Pham Hoa Q.
Rosenberger Richard A.
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