Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate
2006-02-06
2008-11-25
Punnoose, Roy M (Department: 2886)
Optics: measuring and testing
By polarized light examination
With polariscopes
C356S369000
Reexamination Certificate
active
07456962
ABSTRACT:
A polarimeter for receiving input electromagnetic radiation characterized by a polarization state and for determining the polarization state. The polarimeter includes a refractive arrangement for refracting the input electromagnetic radiation so as to provide a spatial pattern corresponding to the polarization state, and an image analysis arrangement for receiving the spatial pattern, producing an electronic image of the spatial pattern, and for determining the polarization state of the input electromagnetic radiation according to the electronic image of the spatial pattern.
REFERENCES:
patent: 4310247 (1982-01-01), Korth et al.
patent: 5237388 (1993-08-01), Hirano et al.
patent: WO 2005/118143 (2005-12-01), None
Wallace, Conical Refraction Becomes Practical, Jun. 2004, Laser Focus World.
Mansuripur, External Conical Refraction, Aug. 1997, Optics & Photonics News, pp. 50-52.
Muller, This is the Story of Conical Refraction that was Discovered more than 150 Years Ago and Only Now Will Come to Real First Applications, Jun. 2004, VCT Website.
Muller, Competition for Applications Based on the Effect of Conical Refraction, Aug. 2004, VCT Website.
Blum Joel R.
Searcy Paul A.
Meadowlark Optics, Inc.
Pritzkau Patent Group LLC
Punnoose Roy M
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