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Sensor unit and distance measurement apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Sensor-illumination system for use in three-dimensional measurem

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Sensors employing interference of electromagnetic waves passing

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Shaft position optical sensor

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Shape detecting apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Shape input device

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Shape measurement apparatus and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Shape measuring device

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Shape measuring instrument

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Shape testing apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Shape-measuring laser apparatus using anisotropic magnification

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Sheet flatness measurement system and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Shoe size selection system and apparatus therefor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Signal waveform detector using synthetic FM demodulation

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Simplified polarization independent optical sampling using a...

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Simultaneous 4-stokes parameter determination using a single...

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Simultaneous 4-stokes parameter determination using a single...

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Simultaneous multiple angle/multiple wavelength ellipsometer and

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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Simultaneous optical isolation and channel monitoring system

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Single blade proximity probe

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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