Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1992-09-21
1995-11-28
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356376, C01B 1130
Patent
active
054713072
ABSTRACT:
A sheet flatness measuring system consists of a frame carrying a structured illumination system for producing illumination beneath the frame in a periodic pattern of opaque and illuminated lines. A flat base or table, having a surface parallel to the structured illumination system, is placed beneath the structured illumination system to be illuminated by it. A sheet of reflective or semi-reflective material, the flatness of which is to be measured, is placed on the table. The reflection of the structured illumination is viewed from the sheet a by video camera, typically mounted in a central location above the center of the table on which the sheet is placed. The structured illumination pattern is moved to different positions, and multiple video images are digitized and compared in a computer to calculate the local slope at each point or pixel in the image of the sheet viewed by the camera. From this slope information, the computer derives an output representative of variations in the surface flatness of the sheet undergoing measurement.
REFERENCES:
patent: 2867149 (1959-01-01), Goddard
patent: 3314328 (1967-04-01), Boettcher
patent: 3858981 (1975-01-01), Jaerisch
patent: 4079252 (1978-03-01), Brake
patent: 4102578 (1978-07-01), Suzuki
patent: 4390277 (1983-06-01), Quinn
patent: 4641972 (1987-02-01), Halioua et al.
patent: 4918321 (1990-04-01), Klenk
patent: 4929846 (1990-05-01), Mansour
patent: 4972093 (1990-11-01), Cochran
Hammond et al. "Detecting Surface Deformities" IBM Technical Disclosure Bulletin, vol. 14, No. 1 (Jun. 1971) pp. 49-50.
Koliopoulos Chris L.
Tang Shouhong
Phase Shift Technology, Inc.
Ptak LaValle D.
Rosenberger Richard A.
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