Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1983-09-01
1987-02-24
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
046453482
ABSTRACT:
A three-dimensional triangulation-type sensor-illumination system adapted for connection to a machine vision computer. The illumination source in the preferred system comprises a unique cross hair light pattern which provides sufficient image data to the computer to enable the computer to make three-dimensional measurements of a wide variety of features, including edges, corners, holes, studs, designated portions of a surface and intersections of surfaces. The illumination source and sensor are both mounted within a single housing in a specific position and orientation relative to one another, thereby permitting the system to be internally calibrated. In addition, the sensor-illuminator unit is preferably mounted in a test fixture so that the light source is substantially normal to the surface of the part to be examined and the sensor is thereby positioned at a perspective angle relative thereto.
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Tolanski, S., "A Topographic Microscope", Scientific American, Aug. 1954, pp. 54-59.
Barlow Neil E.
Dewar Robert
Salinger Jeremy
Waldecker Thomas J.
Perceptron, Inc.
Rosenberger R. A.
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