Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1982-03-29
1984-03-13
Sikes, William L.
Optics: measuring and testing
By polarized light examination
With birefringent element
367149, G01B 902
Patent
active
044364253
ABSTRACT:
A test signal waveform detector that includes a fiber optic interferometer wherein the phase difference of the two parts of a split laser beam is modulated by the waveform of a sinusoidal test signal which is to be detected and by the waveform of a sinusoidal reference signal, and the two parts of the split beam are recombined and mixed on the face of a photodetector. A signal conversion circuit converts the ac signal produced by the photodetector to another ac signal that carries the test signal information as an equivalent frequency modulation, and a demodulator extracts the test signal information from the latter ac signal.
REFERENCES:
patent: 3670098 (1972-06-01), Korpel
patent: 4162397 (1979-07-01), Bucaro et al.
patent: 4313185 (1982-01-01), Chovan
patent: 4320475 (1982-03-01), Leclerc et al.
patent: 4363114 (1982-12-01), Bucaro et al.
Koo et al., "Frequency Mixing in Fibre-Optic Interferometer Systems", Eleonics Letters, vol. 17, No. 11, pp. 380-382, 5/81.
Beers Robert F.
Ellis William T.
Klein Alan P.
Koren Matthew W.
Sikes William L.
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