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Method and system for measuring dimensions of an edge of a part

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method and system for measuring drop-volume in ink-jet printers

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method and system for point by point measurement of spatial coor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method and system for triangulation-based, 3-D imaging utilizing

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method and system for triangulation-based, 3-D imaging utilizing

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method for analyzing periodic brightness patterns

Optics: measuring and testing – By polarized light examination – With light attenuation
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Method for checking lithography critical dimensions

Optics: measuring and testing – By polarized light examination – With light attenuation
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Method for contactless profiling normal to a surface

Optics: measuring and testing – By polarized light examination – With light attenuation
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Method for coplanarity inspection of package or substrate warpag

Optics: measuring and testing – By polarized light examination – With light attenuation
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Method for correcting a measuring signal

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method for detecting a reference position and displacement detec

Optics: measuring and testing – By polarized light examination – With light attenuation
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Method for detecting distance deviations to a photoresist surfac

Optics: measuring and testing – By polarized light examination – With light attenuation
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Method for determining and designing optical elements

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Method for determining reference position

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method for determining the spatial location of points on a specu

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method for dimensional weighing by spaced line projection

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method for executing three-dimensional measurement utilizing cor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method for inspecting height, and a height inspection apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Method for inspecting the curvature of a profile, such an edge o

Optics: measuring and testing – By polarized light examination – With light attenuation
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Method for locating flaws in a smooth surface of an object

Optics: measuring and testing – By polarized light examination – With light attenuation
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