Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-04-27
1997-04-01
Gonzalez, Frank
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
056172095
ABSTRACT:
A method and system for three-dimensional imaging of objects, including integrated circuit interconnections to improve the efficiency of triangulation-based laser line scanning systems. A scanning beam is incident at a normal angle to the X,Y inspection plane with the scan line oriented at 45.degree., diagonal to an axis defining a first direction of motion. Motion of the imaging head along the axis is used to acquire line scan images in the non-orthogonal coordinate system.
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Jackson Robert L.
Noblett David A.
Rohrer Donald K.
Svetkoff Donald J.
Gonzalez Frank
Merlino Amanda
View Engineering, Inc.
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