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Dark field, photon tunneling imaging probes

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Dark field, photon tunneling imaging systems and methods

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Dark field, photon tunneling imaging systems and methods for mea

Optics: measuring and testing – By polarized light examination – With light attenuation
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Dark field, photon tunneling imaging systems and methods for opt

Optics: measuring and testing – By polarized light examination – With light attenuation
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Datum sensing using optical grating

Optics: measuring and testing – By polarized light examination – With light attenuation
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DC Shift error correction for electro-optical measuring system

Optics: measuring and testing – By polarized light examination – With light attenuation
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Deflection unit

Optics: measuring and testing – By polarized light examination – With light attenuation
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Depth measuring apparatus for a dredger

Optics: measuring and testing – By polarized light examination – With light attenuation
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Detected position correcting method

Optics: measuring and testing – By polarized light examination – With light attenuation
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Detecting defects in plastic and similar surfaces

Optics: measuring and testing – By polarized light examination – With light attenuation
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Detection of focal point of objective lens by means of a two-spl

Optics: measuring and testing – By polarized light examination – With light attenuation
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Detection of three-dimensional information using a projected poi

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Detection of three-dimensional information with a projected plan

Optics: measuring and testing – By polarized light examination – With light attenuation
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Determination of coating adhesion

Optics: measuring and testing – By polarized light examination – With light attenuation
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Determining the profile of a surface of an object

Optics: measuring and testing – By polarized light examination – With light attenuation
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Development sensor apparatus for monitoring the progression of d

Optics: measuring and testing – By polarized light examination – With light attenuation
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Device and method for optical detection of the deformation of a

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Device for ascertaining the relative position of a reference...

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Device for checking positional accuracy

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Device for checking the position the coplanarity and the separat

Optics: measuring and testing – By polarized light examination – With light attenuation
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