4. Optics: measuring and testing
  5. By polarized light examination
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Geometric surface inspection system with dual overlap light stri

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Glue drop detector

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Grid array inspection system and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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