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Calibratable optical distance sensing system and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Calibration of three-dimensional space

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Calibration of three-dimensional space

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Calibration system for coordinate measuring machine

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Calibration system for large tooling fixtures

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Characterization of an external silicon interface using optical

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Checking device for flatness of a drive chassis of a disc player

Optics: measuring and testing – By polarized light examination – With light attenuation
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Cloud condensation nucleus spectrometer

Optics: measuring and testing – By polarized light examination – With light attenuation
Reexamination Certificate

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Combined scanning force microscope and optical metrology tool

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Compact laser probe for profilometry

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Component inspection apparatus and method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Component mounter and recognition method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Computerized three dimensional data acquisition apparatus and me

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Configuration detecting method and system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Confocal measuring microscope with automatic focusing

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Contactless relative movement sensor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Continuous contactless measurement of profiles and apparatus for

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Contour line scanner

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Contour measurement system

Optics: measuring and testing – By polarized light examination – With light attenuation
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Contour measuring apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
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