Method for correcting a measuring signal

Details Method for correcting a measuring signal Method for correcting a measuring signal

1981-08-07

1984-08-07

Rosenberger, R. A.

Optics: measuring and testing

By polarized light examination

With light attenuation

356 1, G01B 1100, G01D 302

Patent

active

044640536

ABSTRACT:
A method for correcting a measuring signal which has been generated by an apparatus measuring in contact-free fashion. The apparatus scans a surface to be measured with a light beam, measures the light reflected by the surface by means of an opto-electric detector installation, and generates the measuring signal in dependence upon one or more electrical signals emitted by the detector. In the case of the above-described apparatus, distortions of the electrical signal emitted by the detector, which distortions occur for example through non-uniform scattering ability of the surface to be measured, can result. These distortions lead to measurement errors. Such measurement errors are corrected in the simplest manner possible. For this purpose, the measuring signal is corrected in dependence upon a distortion of an electrical signal.

REFERENCES:
patent: 3796492 (1974-03-01), Cullen et al.
patent: 3885875 (1975-05-01), Rosenfeld et al.
patent: 3923395 (1975-12-01), Bodlaj
patent: 4004239 (1977-01-01), Clarke
patent: 4005281 (1977-01-01), Faulhaber et al.
patent: 4053227 (1977-10-01), Bodlaj

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