Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1995-07-21
1997-05-06
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356237, G01B 1130
Patent
active
056276460
ABSTRACT:
A method for locating flaws in a smooth surface using at least one light source includes the steps of setting the light source at a predetermined length above the smooth surface, locating a highlight line, translating the light source across the smooth surface to create a plurality of highlight lines and locating distortions in the smooth surface.
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Chen Yifan
Stewart Paul J.
Ford Motor Company
Kelley, Esq. David B.
May, Esq. Roger L.
Pham Hoa Q.
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