Method for measuring refractive index of thin film layer

Method for measuring the anisotropy in an element comprising...

Method for measuring the parameter of a rough film

Method for noise improvement in ellipsometers

Method for the determination of characteristic values of transpa

Method for the optical characterization of materials without...

Method of analysis of multiple layer samples

Method of and apparatus for obtaining object data by machine vis

Method of calibrating effects of multi-AOI-system for easy...

Method of correcting azimuth angle of photometric ellipsometers

Method of determining bulk refractive indicies of fluids...

Method of determining bulk refractive indicies of liquids...

Method of determining initial thickness value for sample...

Method of determining initial thickness value for sample...

Method of evaluating an anisotropic thin film and an...

Method of inspecting grain size of a polysilicon film

Method of measuring small pads on a substrate

Method of measuring surface form of semiconductor thin film

Method of measuring surface form of semiconductor thin film

Method of measuring surface reflectance and a method of producin