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Process and apparatus for in-situ qualification of master patter

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Process and apparatus for measuring discoloration

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Process and device for checking the conformity of hybridization

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Process and device for high resolution optical testing of surfac

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Process and device for measuring the optical properties of thin

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Process and device for the measurement of a physical quantity of

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Process and device for the optical testing of a surface

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Process for checking the dimension of a part

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Process for detecting and correcting a misalignment between...

Optics: measuring and testing – By configuration comparison
Reexamination Certificate

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Process for determining and monitoring the shape of the edges of

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Process for measuring the volume of an object by means of a lase

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Process for the determination of thickness of adhesive layers of

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Process monitoring and thickness measurement from the back side

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Profile imaging techniques

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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