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Method and apparatus for measuring thickness of a film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for measuring thickness of thin films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for measuring width of a selvage rubber por

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for monitoring layer erosion in a dry-etchi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for monitoring the deposition rate of films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for non-contact determination of run-out of

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for optical measurement of the dimension of

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for optically checking an electrical compon

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for optically measuring the volume of gener

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for production line screening

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and apparatus for real-time, in-situ endpoint detection a

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for remote detection and thickness measurem

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for remote detection and thickness measurem

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus for white-light dispersed-fringe interferom

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and apparatus of determining the true edge length of a bo

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for coin diameter discrimination

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for contact-free interval or thickness measure

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for controlling the film thickness of evaporat

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for determining the area coverage of an origin

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for determining the thickness and concentricit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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