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Method and apparatus for detecting the endpoint in chemical-mech

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
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Method and apparatus for detecting the endpoint in chemical-mech

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Method and apparatus for determining the degree of oxidation of

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Method and apparatus for determining thickness of an OPC layer o

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Method and apparatus for evaluating the thickness of thin films

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Method and apparatus for film-thickness measurements

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Reexamination Certificate

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Method and apparatus for high speed measurement of oilfield tubu

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Method and apparatus for in-situ monitoring of plasma etch and d

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Method and apparatus for in-situ monitoring of thickness during

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Method and apparatus for independently measuring the thickness a

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Method and apparatus for measurements of patterned structures

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Method and apparatus for measurements of patterned structures

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and apparatus for measuring a coating state

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Method and apparatus for measuring dimensional variables of thre

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Method and apparatus for measuring overclad tubes

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Method and apparatus for measuring the dimensions of an object

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Method and apparatus for measuring the monocrystal diameter and

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Method and apparatus for measuring the thickness of a film using

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Method and apparatus for measuring the thickness of a thin film

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Method and apparatus for measuring the wall thickness of transpa

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