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Method and device for in situ stress measurement within a thin f

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and device for measuring parts

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and device for measuring the length of a light guide

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Method and device for thickness assessment

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method and system for measuring an inner diameter of a hole form

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for controlling the laying of a silicone string, particul

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for detecting obstructed nozzles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for determining optical constants prior to film processin

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for determining the thickness of an optical sample

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for dimensional weighing with optics

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for evaluating epitaxial layers and test pattern for proc

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for film thickness and refractive index determination

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for identifying order skipping in spectroreflective film

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for measuring a physical quantity providing digital data

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for measuring a thickness of a printed circuit board

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for measuring film thickness

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for measuring shape parameters of yarn

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for measuring thickness of films

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for normalizing the detection signals of magnified images

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Method for sensing complete removal of oxide layer from substrat

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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