Device/process for contact free distance and thickness measureme

Details Device/process for contact free distance and thickness measureme Device/process for contact free distance and thickness measureme

1978-04-28

1980-05-06

Evans, F. L.

Optics: measuring and testing

By configuration comparison

With photosensitive film or plate

356 1, 356 4, G01C 308, G01S 962

Patent

active

042014751

ABSTRACT:
A system is disclosed for non-contact distance or thickness measurements. A deflectable laser beam scans the object and produces a measuring impulse during a forward and reverse motion when the laser beam hits a point on an object along a sighting line of a measuring detector. A rectangular pulse is produced from each measuring pulse and rising or falling edges of the rectangular pulse are used for measurement. The impulse widths and possible store times of the evaluation circuitry do not influence the measuring result in the system disclosed.

REFERENCES:
patent: 3923395 (1975-12-01), Bodlaj
patent: 4053234 (1977-10-01), McFarlane
patent: 4068955 (1978-01-01), Bodlaj
patent: 4111552 (1978-09-01), Bodlaj
Bodlaj, V., "Noncontact Measurement of Thickness and Distance by Laser Beam Deflection", Siemens Forsch.-u.Entwickl.-Ber., vol. 4, (1975), No. 6, pp. 336-344.
Bodlaj et al., "Remote Measurement of Distance and Thickness Using a Deflected Laser Beam", Applied Optics, vol. 15, No. 6, Jun. 1976, pp. 1432-1436.

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