Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1986-12-04
1988-11-15
LaRoche, Eugene R.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356405, 356445, 356236, G01B 1106
Patent
active
047853360
ABSTRACT:
An apparatus for determining and displaying selected characteristics of a film formed on the surface of a glass ribbon includes a scanning head mounted on a track for movement above the filmed surface of the glass ribbon. The scanning head has a source of light pulses generated from a tungsten lamp and chopper, filtered to simulate daylight and focused on the filmed surface. An integrating sphere is also mounted on the scanning head and has an entrance port formed in a wall thereof for collecting a portion of the light being reflected from the surface. Optically filtered detectors mounted in detector ports formed in the wall of the sphere generate output signals representing the "Y" and "Z" components of the collected light on the CIE X,Y,Z, tristimulus scale. A programmed microprocessor is responsive to the detector signals and information concerning the position of the scanning head with respect to the surface of the glass ribbon for generating visual displays of selected characteristics such as reflectivity, b* on the CIELAB tristimulus scale and overcoat thickness as a function of the position at which the light beam is reflected from the filmed surface.
REFERENCES:
patent: 3737237 (1973-06-01), Zurasky
patent: 3892490 (1975-07-01), Vetsuki et al.
patent: 3936189 (1976-02-01), De Remigis
patent: 4003660 (1977-01-01), Christie, Jr. et al.
patent: 4012144 (1977-03-01), Hedelman
patent: 4395126 (1983-07-01), Kramer
patent: 4479718 (1984-10-01), Alman
patent: 4606641 (1986-08-01), Yamada et al.
Lee Gregory S.
McComb Walter D.
Rudolph Andrew W.
Schave Richard D.
Ham Seung
LaRoche Eugene R.
Libbey-Owens-Ford Co.
LandOfFree
Device for monitoring characteristics of a film on a substrate does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Device for monitoring characteristics of a film on a substrate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Device for monitoring characteristics of a film on a substrate will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1106191