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Target design and methods for scatterometry overlay...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Target device and use thereof for aligning light beams utilizing

Optics: measuring and testing – By alignment in lateral direction
Patent

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Technique for automated alignment of semiconductor chips

Optics: measuring and testing – By alignment in lateral direction
Patent

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Time measurement device and method useful in a laser range camer

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Transfer apparatus for compensating for a transfer error

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Two stage optical alignment device and method of aligning...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Two-dimensional imaging with line arrays

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Two-dimensional structure for determining an overlay...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Universal alignment marks for semiconductor defect capture and a

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Variable wavelength optical alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Vehicle treatment installation and operating method

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Video positioning system for a pouring vessel

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Visual sensor coordinate system setting jig and setting method

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer alignment device

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer alignment sensor using a phase-shifted microlens array

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Wafer alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Wafer alignment system using parallel imaging detection

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Wafer inspecting apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer level alignment structures using subwavelength grating...

Optics: measuring and testing – By alignment in lateral direction
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Wafer notch dimension measuring apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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