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Alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Alignment system

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Alignment system and lithographic apparatus equipped with...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Alignment system and method using bright spot and box structure

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Alignment system for lithographic proximity printing

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Alignment system for optical lithography

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Alignment system of semiconductor exposure apparatus and...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Alignment system of wafer stage

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Alignment system with large area search for wafer edge and globa

Optics: measuring and testing – By alignment in lateral direction
Patent

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Alignment system, device and method

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Alignment target image enhancement for microlithography process

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Alignment target to be measured with multiple polarization...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Alignment target with designed in offset

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Alignment tool for a lithographic apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Alignment-mark measurements on the backside of a wafer for synch

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Apparatus and method for aligning a mask and wafer in the fabric

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Apparatus and method for aligning machine platens

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Apparatus and method for aligning objects

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Apparatus and method for assembling semiconductor device and...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Apparatus and method for detecting the position and orientation

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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