Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1996-02-09
1999-12-07
Hantis, K. P.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
G01B 1100
Patent
active
059992697
ABSTRACT:
The present invention involves a combination of active and passive optical or opto-electronic device alignment techniques. Passive alignment is used for two axial lateral directions and all three axial rotational directions (yaw, pitch and roll). In such passive alignment, only the substrate is micromachined with passive alignment structures. One-dimensional active alignment is then used for the remaining axial lateral direction.
REFERENCES:
patent: 5042709 (1991-08-01), Cina et al.
patent: 5436996 (1995-07-01), Tabasky et al.
Fletecher "Inexpensive Assembly Technique Promises to Radically Cut the Cost of 1.55 .mu.m Optical-Communication Lasers". Electronic Design Jun. 26, 1995, pp. 32-33.
Boudreau Robert A.
Haugsjaa Paul O.
Urban Michael J.
GTE Laboratories Incorporated
Hantis K. P.
Suchyta Leonard Charles
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