Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1991-06-20
1992-10-13
Evans, F. L.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
250548, G01B 1127
Patent
active
051555573
ABSTRACT:
An alignment detection apparatus for detecting the alignment of a superfine exposure system including an interrupted emission light source. The apparatus is equipped with an output variation monitoring sensor to detect an output variation of the light source and further a photoelectric conversion device to perform the photoelectric conversion of the alignment light to generate discrete photoelectric conversion signals. Also included in the apparatus is an integration and hold circuit to integrate and peak-hold each of the photoelectric conversion signals. This peak-hold values are corrected on the basis of the detected light-source output variation due to the monitoring sensor to output stepwise continuous signals from which a harmonic component is removed by a filter so as to obtain a smooth analog waveform. This analog waveform is processed by a phase detector. The output of the phase detector allows an accurate alignment irrespective of using the interrupted emission light source.
REFERENCES:
patent: 3943359 (1976-03-01), Matsumoto et al.
patent: 4531060 (1985-07-01), Suwa et al.
patent: 4780616 (1988-10-01), Nishi et al.
patent: 4814829 (1989-03-01), Kosugi et al.
Iwazawa Toshiyuki
Nakanishi Yoshihito
Sato Takeo
Yamamoto Masaki
Evans F. L.
Matsushita Electric - Industrial Co., Ltd.
LandOfFree
Optical alignment detection apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Optical alignment detection apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Optical alignment detection apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1304787