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Calibration method for a lithographic apparatus and device...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Centering device for the manufacture of a center hole in disks

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Component transporting apparatus and method

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Cross correlation image sensor alignment system

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Detecting assembly for a multi-axis machine tool

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Device for and method of aligning two bodies

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Device for controlling the position of a drift advancing machine

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Device for observing alignment marks on a mask and wafer

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Device to measure the alignment of a laser amplification system

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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EGA alignment method using a plurality of weighting coefficients

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Electronic device for determining a register error in multi-colo

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Electronic part installation apparatus and method thereof

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Enhanced overlay measurement marks for overlay alignment and...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Exposure field sensor of a chip leveling apparatus having an ape

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Exposure method and apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Exposure method and apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Exposure method, exposure apparatus, and method for...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Fabrication and alignment device

Optics: measuring and testing – By alignment in lateral direction – With light detector
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