Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent
1997-07-15
1999-07-20
Kim, Robert H.
Optics: measuring and testing
By alignment in lateral direction
With light detector
356153, G01B 1126
Patent
active
059262818
ABSTRACT:
A device for the alignment of a laser beam amplification system comprises at least measuring means and alignment templates positioned instead of filtering hole plates of the amplification system, the alignment templates having holes whose centers have substantially the same spatial positions as the centers of the filtering holes, certain template holes being provided with reference sights offset in an angular way with respect to one another, the tips of these sights being pointed towards the center of the holes, the measuring means defining, by sighting at the end of the amplification system, the divergences between the focusing points of the beam in the holes, merged at a single point, and the tips of the sights, their angular positions enabling them to be assigned to their respective holes, the positions of elements of the amplification system being then controlled as a function of the measurements of divergences. Application to the automating setting of alignment, especially in the case of large numbers of parallel amplification systems.
REFERENCES:
patent: 4575849 (1986-03-01), Chun
patent: 4794344 (1988-12-01), Johnson
patent: 5072135 (1991-12-01), Huignard et al.
patent: 5173910 (1992-12-01), Pocholle et al.
patent: 5259567 (1993-11-01), Jano et al.
patent: 5467193 (1995-11-01), Laewen et al.
patent: 5490643 (1996-02-01), Jano et al.
Delon Michel
Gauthier Fran.cedilla.ois-Hugues
Jano Patrice
Rioland Jacques
Kim Robert H.
Smith Zandra V.
Thomas-CSF
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