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Pattern alignment system and method

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Phase contrast alignment system for a semiconductor manufacturin

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Photoelectric detecting device

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Photomask alignment system

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Position detecting device

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Position detection method and apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Positional measurement projecting device and mounting structure

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Positioning apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Positioning device

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Positioning device having two manipulators operating in parallel

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Process and device for ascertaining whether two successive...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Process and device for determining the center-line of a curvatur

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Projection exposure apparatus and method for controlling a stage

Optics: measuring and testing – By alignment in lateral direction – With light detector
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Projection exposure method

Optics: measuring and testing – By alignment in lateral direction – With light detector
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