Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent
1988-07-12
1989-05-16
Laroche, Eugene R.
Optics: measuring and testing
By alignment in lateral direction
With light detector
356375, G01B 1114
Patent
active
048304980
ABSTRACT:
A position detecting device for detecting the position of an object includes an illumination optical system for producing a light beam and for irradiating the object with the light beam, an optical system for focusing the light beam, a focus position controlling system operative to change the position at which the light beam is focused by the focusing optical system, a first detecting device for receiving the light beam reflected from the object to detect the state of incidence of the light beam on the object, and a second detecting device for detecting the position of the object on the basis of the detection of the state of incidence of the light beam on the object by the first detecting means.
REFERENCES:
patent: 3565532 (1971-02-01), Heitmann et al.
patent: 4124273 (1978-11-01), Huignard et al.
Korth, "Laser Scanning Exposure System with Active Focus Control", IBM Tech. Disc. Bulletin, vol. 26, No. 9, Feb. 1984.
Japanese Publication "1983 Seiki Gakkai Autumn Conference Lecture Meeting Papers", pp. 391 and 392.
Atsuta Akio
Kariya Takao
Kawai Yasuo
Nishimoto Yoshifumi
Okunuki Masahiko
Canon Kabushiki Kaisha
LaRoche Eugene R.
Pascal Robert J.
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