LandOfFree - US Patents - Listing for Measuring and testing,Surface and cutting edge testing,Roughness

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic photo-absorption force microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Atomic probe microscope and cantilever unit for use in the micro

Measuring and testing – Surface and cutting edge testing – Roughness

Augmenting reality system for real-time nanomanipulation...

Measuring and testing – Surface and cutting edge testing – Roughness

Automatic atomic force microscope with piezotube scanner

Measuring and testing – Surface and cutting edge testing – Roughness

Balanced momentum probe holder

Measuring and testing – Surface and cutting edge testing – Roughness

Ball lock punch retainer

Measuring and testing – Surface and cutting edge testing – Roughness

Beam tracking system for scanning-probe type atomic force...

Measuring and testing – Surface and cutting edge testing – Roughness

Calibration standard for 2-D and 3-D profilometry in the sub-nan

Measuring and testing – Surface and cutting edge testing – Roughness

Caliper method, system, and apparatus

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever and method of using same to detect features on a surf

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever and process for fabricating it

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever chip for use in scanning probe microscope

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever deflection sensor and use thereof

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for a scanning probe microscope and a method of manuf

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for atomic force microscope and method of manufacturi

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for atomic force microscope and method of manufacturi

Measuring and testing – Surface and cutting edge testing – Roughness

Cantilever for scanning probe microscope